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	<title>Comments on: Have you experienced a “bad luck” test failure?</title>
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	<link>http://www.embeddedinsights.com/channels/2011/12/07/have-you-experienced-a-%e2%80%9cbad-luck%e2%80%9d-test-failure/</link>
	<description>Shedding Light on the Hidden World of Embedded Systems</description>
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		<title>By: D. @ LI</title>
		<link>http://www.embeddedinsights.com/channels/2011/12/07/have-you-experienced-a-%e2%80%9cbad-luck%e2%80%9d-test-failure/#comment-10499</link>
		<dc:creator>D. @ LI</dc:creator>
		<pubDate>Mon, 12 Dec 2011 17:59:41 +0000</pubDate>
		<guid isPermaLink="false">http://www.embeddedinsights.com/channels/?p=665#comment-10499</guid>
		<description>I agree with Chris - those failures had nothing to do with luck.

The fuel issue was two different design problems, the first not having any way to empty a fuelled launcher, and the second not appreciating the effects that prolonged exposure to the fuel would have on the seals.

The change of cycle rate for only part of the project was a lack-of-design problem!</description>
		<content:encoded><![CDATA[<p>I agree with Chris &#8211; those failures had nothing to do with luck.</p>
<p>The fuel issue was two different design problems, the first not having any way to empty a fuelled launcher, and the second not appreciating the effects that prolonged exposure to the fuel would have on the seals.</p>
<p>The change of cycle rate for only part of the project was a lack-of-design problem!</p>
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		<title>By: R. @ LI</title>
		<link>http://www.embeddedinsights.com/channels/2011/12/07/have-you-experienced-a-%e2%80%9cbad-luck%e2%80%9d-test-failure/#comment-10420</link>
		<dc:creator>R. @ LI</dc:creator>
		<pubDate>Sat, 10 Dec 2011 21:04:43 +0000</pubDate>
		<guid isPermaLink="false">http://www.embeddedinsights.com/channels/?p=665#comment-10420</guid>
		<description>1. Plugged in one more card into the test equipment rack. The failure (that took a while to diagnose) was that the power supply was under-specified. The result was anomalies in the test equipment that were seen as anomalies in the UUT (unit under test).

2. The air-conditioning unit in the ceiling of the lab failed and dripped water right on top of the UUT.

3. The equipment when delivered was too tall for the doorway of the receiving bay.

4. Airflow plenums in the UUT were accidentally shaped in a manner as to condense water - right into the UUT.

5. Levered my finger against a toggle switch. It didn&#039;t move. Pressed harder - it broke. It needed to be &quot;pulled&quot; slightly before pressing.

6. Plugged a 12v supply into a 6v device. The &quot;adapter&quot; for connecting 6v and 12v was the same.

These were different projects (mostly) I could go on.</description>
		<content:encoded><![CDATA[<p>1. Plugged in one more card into the test equipment rack. The failure (that took a while to diagnose) was that the power supply was under-specified. The result was anomalies in the test equipment that were seen as anomalies in the UUT (unit under test).</p>
<p>2. The air-conditioning unit in the ceiling of the lab failed and dripped water right on top of the UUT.</p>
<p>3. The equipment when delivered was too tall for the doorway of the receiving bay.</p>
<p>4. Airflow plenums in the UUT were accidentally shaped in a manner as to condense water &#8211; right into the UUT.</p>
<p>5. Levered my finger against a toggle switch. It didn&#8217;t move. Pressed harder &#8211; it broke. It needed to be &#8220;pulled&#8221; slightly before pressing.</p>
<p>6. Plugged a 12v supply into a 6v device. The &#8220;adapter&#8221; for connecting 6v and 12v was the same.</p>
<p>These were different projects (mostly) I could go on.</p>
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		<title>By: J. @ LI</title>
		<link>http://www.embeddedinsights.com/channels/2011/12/07/have-you-experienced-a-%e2%80%9cbad-luck%e2%80%9d-test-failure/#comment-10419</link>
		<dc:creator>J. @ LI</dc:creator>
		<pubDate>Sat, 10 Dec 2011 21:04:23 +0000</pubDate>
		<guid isPermaLink="false">http://www.embeddedinsights.com/channels/?p=665#comment-10419</guid>
		<description>Mismatched software units failures have occured far too often and cannot be blamed on &quot;Bad Luck&quot;. Some can occur due to incomplete and inadequate systems engineering specifications and some have been due to &quot;Software Reuse&quot;. Both types of errors can and should be eliminated in early development design/interface reviews.</description>
		<content:encoded><![CDATA[<p>Mismatched software units failures have occured far too often and cannot be blamed on &#8220;Bad Luck&#8221;. Some can occur due to incomplete and inadequate systems engineering specifications and some have been due to &#8220;Software Reuse&#8221;. Both types of errors can and should be eliminated in early development design/interface reviews.</p>
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		<title>By: R. @ LI</title>
		<link>http://www.embeddedinsights.com/channels/2011/12/07/have-you-experienced-a-%e2%80%9cbad-luck%e2%80%9d-test-failure/#comment-10418</link>
		<dc:creator>R. @ LI</dc:creator>
		<pubDate>Sat, 10 Dec 2011 21:04:07 +0000</pubDate>
		<guid isPermaLink="false">http://www.embeddedinsights.com/channels/?p=665#comment-10418</guid>
		<description>Bad luck and trouble&#039;s my only friend. If I didn&#039;t have bad luck, I wouldn&#039;t have no luck at all.

&quot;management&quot; or whoever cannot be expected to know everything that could occur out there in the real world, to plan perfectly one would have to know everything, and if you tried to do that you would end up with paralysis by analysis.

The point is to have &quot;resilience&quot; - the ability to recover when things don&#039;t go according to plan.</description>
		<content:encoded><![CDATA[<p>Bad luck and trouble&#8217;s my only friend. If I didn&#8217;t have bad luck, I wouldn&#8217;t have no luck at all.</p>
<p>&#8220;management&#8221; or whoever cannot be expected to know everything that could occur out there in the real world, to plan perfectly one would have to know everything, and if you tried to do that you would end up with paralysis by analysis.</p>
<p>The point is to have &#8220;resilience&#8221; &#8211; the ability to recover when things don&#8217;t go according to plan.</p>
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		<title>By: D. @ LI</title>
		<link>http://www.embeddedinsights.com/channels/2011/12/07/have-you-experienced-a-%e2%80%9cbad-luck%e2%80%9d-test-failure/#comment-10416</link>
		<dc:creator>D. @ LI</dc:creator>
		<pubDate>Sat, 10 Dec 2011 21:02:35 +0000</pubDate>
		<guid isPermaLink="false">http://www.embeddedinsights.com/channels/?p=665#comment-10416</guid>
		<description>&quot;Bad luck&quot; is a managerial euphamism for mis-managment. Don&#039;t ever use it it provided liscense to those who make decisions without understanding the implications of those decisions.


Clearly the test planing team did not do an adequate analysis. (risk assement associated with time delay after fueling). More importantly, however, the test was a success. You learned that seals deteriorate (there clearly were cheaper ways to accomplish this, why those evaluations were not conducted is another question). As NASA learned during the administration of Ronald Regan, when they decided to launch on a rather cold day.</description>
		<content:encoded><![CDATA[<p>&#8220;Bad luck&#8221; is a managerial euphamism for mis-managment. Don&#8217;t ever use it it provided liscense to those who make decisions without understanding the implications of those decisions.</p>
<p>Clearly the test planing team did not do an adequate analysis. (risk assement associated with time delay after fueling). More importantly, however, the test was a success. You learned that seals deteriorate (there clearly were cheaper ways to accomplish this, why those evaluations were not conducted is another question). As NASA learned during the administration of Ronald Regan, when they decided to launch on a rather cold day.</p>
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		<title>By: C. @ LI</title>
		<link>http://www.embeddedinsights.com/channels/2011/12/07/have-you-experienced-a-%e2%80%9cbad-luck%e2%80%9d-test-failure/#comment-10415</link>
		<dc:creator>C. @ LI</dc:creator>
		<pubDate>Sat, 10 Dec 2011 21:02:09 +0000</pubDate>
		<guid isPermaLink="false">http://www.embeddedinsights.com/channels/?p=665#comment-10415</guid>
		<description>You make your own bad luck.</description>
		<content:encoded><![CDATA[<p>You make your own bad luck.</p>
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